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Journal description
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Details for article 11 of 24 found articles
| Title: |
Gate length dependence of bias temperature instability behavior in short channel SOI MOSFETs |
| Author: |
Wu, Wangran Lu, J. Liu, Chang Wu, Heng Tang, Xiaoyu Sun, Jiabao Zhang, Rui Yu, Wenjie Wang, Xi Zhao, Yi |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 62 (2016) nr. C pages 3 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 24 found articles
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