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Journal description
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Details for article 16 of 27 found articles
| Title: |
Influence of channel length and high-K oxide thickness on subthreshold analog/RF performance of graded channel and gate stack DG-MOSFETs |
| Author: |
Swain, Sanjit Kumar Dutta, Arka Adak, Sarosij Pati, Sudhansu Kumar Sarkar, Chandan Kumar |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 61 (2016) nr. C pages 6 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 27 found articles
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