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Journal description
All volumes of the corresponding journal
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Details for article 13 of 27 found articles
| Title: |
Electrical properties of carbon nanotube via interconnects for 30nm linewidth and beyond |
| Author: |
Vyas, Anshul A. Zhou, Changjian Wilhite, Patrick Wang, Phillip Yang, Cary Y. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 61 (2016) nr. C pages 8 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 27 found articles
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