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Details for article 4 of 22 found articles
| Title: |
A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors |
| Author: |
Wang, Weiliang Khan, Karim Zhang, Xingye Qin, Haiming Jiang, Jun Miao, Lijing Jiang, Kemin Wang, Pengjun Dai, Mingzhi Chu, Junhao |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 60 (2016) nr. C pages 3 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 22 found articles
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