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Journal description
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Details for article 21 of 22 found articles
| Title: |
Time dependent modeling of single particle displacement damage in silicon devices |
| Author: |
Tang, Du Martin-Bragado, Ignacio He, Chaohui Zang, Hang Xiong, Cen Li, Yonghong Guo, Daxi Zhang, Peng Zhang, Jinxin |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 60 (2016) nr. C pages 8 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 22 found articles
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