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Journal description
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Details for article 6 of 21 found articles
| Title: |
Degradation of pMOSFETs due to hot electron induced punchthrough |
| Author: |
Son, Donghee Kim, Gang-Jun Seo, Ji-Hoon Lee, Nam-Hyun Kang, YongHa Kang, Bongkoo |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 59 (2016) nr. C pages 5 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 21 found articles
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