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Journal description
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Details for article 11 of 21 found articles
| Title: |
Electrical characteristics of a-IGZO transistors along the in-plane axis during outward bending |
| Author: |
Park, Chang Bum Na, HyungIl Yoo, Soon Sung Park, Kwon-Shik |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 59 (2016) nr. C pages 7 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 21 found articles
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