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Journal description
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Details for article 8 of 29 found articles
| Title: |
Electro-thermal simulation of current sharing in silicon and silicon carbide power modules under short circuit condition of types I and II |
| Author: |
Suzuki, Hiroshi Ciappa, Mauro |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 58 (2016) nr. C pages 5 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 29 found articles
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