|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 28 of 29 found articles
| Title: |
The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination |
| Author: |
Rahimo, Munaf Richter, Frank Fischer, Fabian Vemulapati, Umamaheswara Kopta, Arnost Corvasce, Chiara Geissmann, Silvan Bellini, Marco Bayer, Martin Bauer, Friedhelm |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 58 (2016) nr. C pages 7 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 29 found articles
| << previous | next >> |