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Journal description
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Details for article 10 of 29 found articles
| Title: |
Formation mechanism of concave by dielectric breakdown on silicon carbide metal-oxide-semiconductor capacitor |
| Author: |
Sato, Soshi Yamabe, Kikuo Endoh, Tetsuo Niwa, Masaaki |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 58 (2016) nr. C pages 7 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 29 found articles
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