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                                       Details for article 5 of 21 found articles
 
 
  Diamond layout style impact on SOI MOSFET in high temperature environment
 
 
Title: Diamond layout style impact on SOI MOSFET in high temperature environment
Author: Gimenez, Salvador Pinillos
Galembeck, Egon Henrique Salerno
Renaux, Christian
Flandre, Denis
Appeared in: Microelectronics reliability
Paging: Volume 55 (2015) nr. 5 pages 6 p.
Year: 2015
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 21 found articles
 
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