|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 20 of 21 found articles
| Title: |
Thermo-mechanical characterization of passive stress sensors in Si interposer |
| Author: |
Vianne, Benjamin Bar, Pierre Fiori, Vincent Gallois-Garreignot, Sébastien Ewuame, Komi Atchou Chausse, Pascal Escoubas, Stéphanie Hotellier, Nicolas Thomas, Olivier |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 5 pages 9 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 21 found articles
| << previous | next >> |