|
| << previous |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 25 of 25 found articles
| Title: |
Variability and reliability analysis of CNFET technology: Impact of manufacturing imperfections |
| Author: |
Almudever, Carmen G. Rubio, Antonio |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 2 pages 9 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 25 found articles
| << previous |