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  Improved performance of nanoscale junctionless transistor based on gate engineering approach
 
 
Title: Improved performance of nanoscale junctionless transistor based on gate engineering approach
Author: Wang, Ying
Shan, Chan
Dou, Zheng
Wang, Li-guo
Cao, Fei
Appeared in: Microelectronics reliability
Paging: Volume 55 (2015) nr. 2 pages 8 p.
Year: 2015
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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