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Journal description
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Details for article 14 of 31 found articles
| Title: |
Heavy-ion irradiation study in SOI-based and bulk-based junctionless FinFETs using 3D-TCAD simulation |
| Author: |
Vinodhkumar, N. Bhuvaneshwari, Y.V. Nagarajan, K.K. Srinivasan, R. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 12PB pages 7 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 31 found articles
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