|
| next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 1 of 31 found articles
| Title: |
Accelerated aging and thermal cycling of low melting temperature alloys as wet thermal interface materials |
| Author: |
Roy, Chandan K. Bhavnani, Sushil Hamilton, Michael C. Johnson, R. Wayne Knight, Roy W. Harris, Daniel K. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 12PB pages 7 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 31 found articles
| next >> |