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Journal description
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Details for article 8 of 21 found articles
| Title: |
Fast atom bombardment onto vertically aligned multi-walled carbon nanotube bumps to achieve low interconnect resistance with Au layer |
| Author: |
Fujino, Masahisa Soga, Ikuo Kondo, Daiyu Ishizuki, Yoshikatsu Iwai, Taisuke Suga, Tadatomo |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 12PA pages 5 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 21 found articles
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