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Journal description
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Details for article 18 of 21 found articles
| Title: |
Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence |
| Author: |
Brazzini, Tommaso Casbon, Michael A. Sun, Huarui Uren, Michael J. Lees, Jonathan Tasker, Paul J. Jung, Helmut Blanck, Hervé Kuball, Martin |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 12PA pages 6 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 21 found articles
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