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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 12 of 21 found articles
| Title: |
Operating channel temperature in GaN HEMTs: DC versus RF accelerated life testing |
| Author: |
Pomeroy, J.W. Uren, M.J. Lambert, B. Kuball, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 12PA pages 6 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 21 found articles
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