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Journal description
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Details for article 38 of 38 found articles
| Title: |
The effect of external stress on the properties of AlGaAs/GaAs single quantum well laser diodes |
| Author: |
Zhu, Hui Liu, Kun Xiong, Cong Feng, Shiwei Guo, Chunsheng |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 1 pages 4 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 38 of 38 found articles
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