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                                       Details for article 22 of 141 found articles
 
 
  Comparative soft error evaluation of layout cells in FinFET technology
 
 
Title: Comparative soft error evaluation of layout cells in FinFET technology
Author: Artola, L.
Hubert, G.
Alioto, M.
Appeared in: Microelectronics reliability
Paging: Volume 54 (2014) nr. 9-10 pages 6 p.
Year: 2014
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 22 of 141 found articles
 
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