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Journal description
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Details for article 14 of 20 found articles
| Title: |
OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review |
| Author: |
Varghese, D. Reddy, V. Krishnan, S. Alam, M.A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 8 pages 12 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 20 found articles
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