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Journal description
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Details for article 50 of 54 found articles
| Title: |
Temperature dependences of threshold voltage and drain-induced barrier lowering in 60nm gate length MOS transistors |
| Author: |
Chen, Zehua Wong, Hei Han, Yan Dong, Shurong Yang, B.L. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 6-7 pages 6 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 50 of 54 found articles
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