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Journal description
All volumes of the corresponding journal
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Details for article 40 of 54 found articles
| Title: |
Robustness measurement of integrated circuits and its adaptation to aging effects |
| Author: |
Barke, Martin Kaergel, Michael Olbrich, Markus Schlichtmann, Ulf |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 6-7 pages 8 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 40 of 54 found articles
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