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Journal description
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Details for article 7 of 20 found articles
| Title: |
Comparison between trap and self-heating induced mobility degradation in AlGaN/GaN HEMTs |
| Author: |
Kalavagunta, Aditya Mukherjee, Shubhajit Reed, Robert Schrimpf, R.D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 3 pages 5 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 20 found articles
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