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Journal description
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Details for article 6 of 23 found articles
| Title: |
High temperature bias-stress-induced instability in power trench-gated MOSFETs |
| Author: |
Hao, J. Rioux, M. Suliman, S.A. Awadelkarim, O.O. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 2 pages 374-380 |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 23 found articles
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