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Details for article 20 of 23 found articles
| Title: |
Reliability of the doping concentration in an ultra-thin body and buried oxide silicon on insulator (SOI) and comparison with a partially depleted SOI |
| Author: |
Chang, Wen-Teng Lai, Chun-Ming Yeh, Wen-Kuan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 2 pages 485-489 |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 23 found articles
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