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Journal description
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Details for article 16 of 23 found articles
| Title: |
Parametric defect localization on integrated circuits – From static laser stimulation to real-time variation mapping (RTVM) |
| Author: |
Saury, L. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 2 pages 366-373 |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 23 found articles
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