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Journal description
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Details for article 43 of 43 found articles
| Title: |
The transient analysis of latch-up in CMOS transmission gate induced by laser |
| Author: |
Qiu, Weicheng Cheng, Xiang-Ai Wang, Rui Xu, Zhongjie Shen, Chao |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 12 pages 7 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 43 of 43 found articles
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