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Journal description
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Details for article 3 of 43 found articles
| Title: |
Analysis and resolution of a thermally accelerated early life failure mechanism in a 40V GaN FET |
| Author: |
Gajewski, Donald A. Lewis, Randall D. Decker, Benjamin M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 12 pages 7 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 43 found articles
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