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Journal description
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Details for article 42 of 49 found articles
| Title: |
Temperature dependent subthreshold model of long channel GAA MOSFET including localized charges to study variations in its temperature sensitivity |
| Author: |
Gautam, Rajni Saxena, Manoj Gupta, R.S. Gupta, Mridula |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 1 pages 7 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 42 of 49 found articles
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