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Journal description
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Details for article 32 of 49 found articles
| Title: |
Quality assessment of ZnO-based varistors by 1/f noise |
| Author: |
Hasse, Lech Z. Babicz, Sylwia Kaczmarek, Leszek Smulko, Janusz M. Sedlakova, Vlasta |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 1 pages 8 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 32 of 49 found articles
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