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Journal description
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Details for article 13 of 28 found articles
| Title: |
Investigation of dynamic color deviation mechanisms of high power light-emitting diode |
| Author: |
Fu, Han-Kuei Lin, Chin-Wei Chen, Tzung-Te Chen, Chiu-Ling Chou, Pei-Ting Sun, Chien-Jen |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 52 (2012) nr. 5 pages 6 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 28 found articles
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