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                                       Details for article 10 of 27 found articles
 
 
  Electro- and thermo-migration induced failure mechanisms in Package on Package
 
 
Title: Electro- and thermo-migration induced failure mechanisms in Package on Package
Author: Meinshausen, L.
Weide-Zaage, K.
Frémont, H.
Appeared in: Microelectronics reliability
Paging: Volume 52 (2012) nr. 12 pages 18 p.
Year: 2012
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 27 found articles
 
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