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Journal description
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Details for article 21 of 40 found articles
| Title: |
Investigations on electrical characteristics and reliability properties of MOS capacitors using HfAlO x on n-GaAs substrates |
| Author: |
Das, P.S. Biswas, Abhijit |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 52 (2012) nr. 1 pages 6 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 40 found articles
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