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Journal description
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Details for article 19 of 40 found articles
| Title: |
Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors |
| Author: |
Douglas, E.A. Chang, C.Y. Gila, B.P. Holzworth, M.R. Jones, K.S. Liu, L. Kim, Jinhyung Jang, Soohwan Via, G.D. Ren, F. Pearton, S.J. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 52 (2012) nr. 1 pages 6 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 40 found articles
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