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Journal description
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Details for article 3 of 21 found articles
| Title: |
Characterization and modeling of hot carrier injection in LDMOS for L-band radar application |
| Author: |
Lachéze, L. Latry, O. Dherbécourt, P. Mourgues, K. Purohit, V. Maanane, H. Sipma, J.P. Cornu, F. Eudeline, P. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 8 pages 6 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 21 found articles
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