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Journal description
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Details for article 6 of 26 found articles
| Title: |
Improvement of immunity on MeV electron radiation of MOS structures by means of ultra-shallow fluorine implantation |
| Author: |
Kalisz, Małgorzata Mroczyński, Robert Beck, Romuald B. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 7 pages 4 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 26 found articles
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