|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 12 of 26 found articles
| Title: |
Investigation of the short-time high-current behavior of vias manufactured in hybrid thick-film technology |
| Author: |
Ortolino, Dominique Kita, Jaroslaw Wurm, Roland Blum, Emmanuel Beart, Karin Moos, Ralf |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 7 pages 7 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 26 found articles
| << previous | next >> |