|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 12 of 20 found articles
| Title: |
Measuring time-dependent deformations in metallic MEMS |
| Author: |
Bergers, L.I.J.C. Hoefnagels, J.P.M. Delhey, N.K.R. Geers, M.G.D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 6 pages 6 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 20 found articles
| << previous | next >> |