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Journal description
All volumes of the corresponding journal
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Details for article 12 of 24 found articles
| Title: |
Investigation of the heel crack mechanism in Al connections for power electronics modules |
| Author: |
Celnikier, Y. Benabou, L. Dupont, L. Coquery, G. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 5 pages 10 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 24 found articles
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