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Journal description
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Details for article 5 of 29 found articles
| Title: |
Characteristics of the intrinsic defects in unintentionally doped 4H–SiC after thermal annealing |
| Author: |
Cheng, Ping Zhang, Yu-ming Zhang, Yi-men |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 3 pages 4 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 29 found articles
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