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Journal description
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Details for article 24 of 48 found articles
| Title: |
Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer |
| Author: |
Roda Neve, C. Kilchytska, V. Alvarado, J. Lederer, D. Militaru, O. Flandre, D. Raskin, J.-P. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 2 pages 6 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 24 of 48 found articles
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