Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 47 of 59 found articles
 
 
  Substrate-engineered GGNMOS for low trigger voltage ESD in 65nm CMOS process
 
 
Title: Substrate-engineered GGNMOS for low trigger voltage ESD in 65nm CMOS process
Author: Ma, Fei
Han, Yan
Song, Bo
Dong, Shurong
Miao, Meng
Zheng, Jianfeng
Wu, Jian
Zhu, Kehan
Appeared in: Microelectronics reliability
Paging: Volume 51 (2011) nr. 12 pages 5 p.
Year: 2011
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 47 of 59 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands