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                                       Details for article 18 of 59 found articles
 
 
  Evaluating nanotribological behavior of annealing Si0.8Ge0.2/Si films
 
 
Title: Evaluating nanotribological behavior of annealing Si0.8Ge0.2/Si films
Author: Wu, Ming-Jhang
Wen, Hua-Chiang
Wu, Shyh-Chi
Yang, Ping-Feng
Lai, Yi-Shao
Hsu, Wen-Kuang
Wu, Wen-Fa
Chou, Chang-Pin
Appeared in: Microelectronics reliability
Paging: Volume 51 (2011) nr. 12 pages 5 p.
Year: 2011
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18 of 59 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands