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                                       Details for article 89 of 140 found articles
 
 
  Methods to improve reliability of bulge test technique to extract mechanical properties of thin films
 
 
Title: Methods to improve reliability of bulge test technique to extract mechanical properties of thin films
Author: Youssef, H.
Ferrand, A.
Calmon, P.
Pons, P.
Plana, R.
Appeared in: Microelectronics reliability
Paging: Volume 50 (2010) nr. 9-11 pages 6 p.
Year: 2010
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 89 of 140 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands