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Journal description
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Details for article 86 of 140 found articles
| Title: |
Mechanical and thermal reliability of printed organic thin-film transistor |
| Author: |
Boddaert, X. Bensaid, B. Benaben, P. Gwoziecki, R. Coppard, R. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 9-11 pages 4 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 86 of 140 found articles
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