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Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS–BICMOS technologies |
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Title: |
Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS–BICMOS technologies |
Author: |
Galy, Ph. Dudit, S. Vallet, M. Larre, Ph. Bilinski, M. Petit, E. Beltritti, J. Dray, A. Jimenez, J. Jezequel, F. Chevallier, R. Boutonnat, C. Varo, V. |
Appeared in: |
Microelectronics reliability |
Paging: |
Volume 50 (2010) nr. 9-11 pages 5 p. |
Year: |
2010 |
Contents: |
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Publisher: |
Elsevier Ltd |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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