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                                       Details for article 75 of 140 found articles
 
 
  Interface traps density-of-states as a vital component for hot-carrier degradation modeling
 
 
Title: Interface traps density-of-states as a vital component for hot-carrier degradation modeling
Author: Tyaginov, S.E.
Starkov, I.A.
Triebl, O.
Cervenka, J.
Jungemann, C.
Carniello, S.
Park, J.M.
Enichlmair, H.
Karner, M.
Kernstock, Ch.
Seebacher, E.
Minixhofer, R.
Ceric, H.
Grasser, T.
Appeared in: Microelectronics reliability
Paging: Volume 50 (2010) nr. 9-11 pages 6 p.
Year: 2010
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 75 of 140 found articles
 
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