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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 33 of 140 found articles
| Title: |
Coupled measurement-simulation procedure for very high power fast recovery – Soft behavior diode design and testing |
| Author: |
Bertoluzza, F. Cova, P. Delmonte, N. Pampili, P. Portesine, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 9-11 pages 5 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 33 of 140 found articles
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